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PG TXRF9 Total Reflection X-ray Flourescence Spectrometry

 

 
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PG TXRF9 Total Reflection X-ray Flourescence Spectrometry

 

 

 

PG TXRF9

Product Overview

TXRF has developed as a technique of simultaneous analysis of multi element in recent years.  The scattering background of TXRF spectrum is four order lower than that of the energy dispersive X-ray fluorescence ( EDXRF) spectrum.  Its energy resolution and sensitivity is greatly improved.  The effect of fluctuation in background intensity is avoided in TXRF measurement. The techniques of TXRF emcompass the advantage of EDXRF.  This emerging new technique plays a vital role for elemental analysis today.

TXRF Is a variant of wave dispersive x-ray fluorescene. Reliable results can be obtained at low concentration levels within selected microareas or at limited sample volume. The TXRF method is simpler, more convenient, economical than that of WDXRF.  Furthermore the consumption of samples is lower in TXRF than WDXRF analysis.

The TXRF method could analyze the elements from 11Na to 92U. Thirty elements could be analyzed simultaneously. The same work cannot be completed by ETAAS and FAAS. Compared to ICP MS, GDMS and neutron activation ( NAA) etc.

 

Product Features:

1	Simultaneous analysis of multiple elements – 30 element can be analyzed simultaneously
2	Low Detection Limit – The lowest absolute detection limit : Pico-gram level ( 10 – 12 g).  The lowest relative detection limit : nano-gram per millimeter level (10-9)
3	Wide Range of Elemental Determination – The elements which could be analyzed by TXRF9 ranging from 11Na to 92U.
4	Low Consumption of samples m L or m g level.
5	Uncomplicated Sample Preparation Requirement – powder , suspension liquid and samples that could provide a plane could be directly determined without pre-treatment. The lowest detection limit is up to ng/g level.
6	Fast Analysis Time – Analysis time from 10 second to 1000 second